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Silicon Nitride Sputtering Target (Si₃N₄)

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The S4R Silicon Nitride Sputtering Target (Si₃N₄) is manufactured from 99.99% (4N) silicon nitride ceramic for physical vapor deposition (PVD) and RF magnetron sputtering applications.

Silicon nitride is an electrically insulating nitride ceramic valued for its high hardness, chemical resistance, thermal stability and dielectric properties. Si₃N₄ sputtering targets are suitable for the deposition of dielectric and passivation layers, protective and barrier coatings, semiconductor thin films, optical coatings and advanced thin-film research.

Standard S4R targets are supplied as circular discs in 2-inch and 3-inch diameters with a nominal thickness of 3 mm. Alternative dimensions, thicknesses and bonded configurations are available upon request.

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Sputtering and Compatibility

Silicon nitride is an electrically insulating ceramic material. RF magnetron sputtering is therefore the recommended standard deposition method for direct sputtering from a Si₃N₄ target.

Actual deposition conditions depend on the sputtering-source design, RF generator and matching network, applied RF power and power density, working pressure, process-gas composition, target-to-substrate distance, substrate material and temperature, target cooling and required film properties.

S4R does not specify universal RF power, working pressure, nitrogen content, substrate temperature or deposition rate. These parameters must be established according to the sputtering system, target dimensions and required film characteristics.

The stoichiometry, density, residual stress, refractive index, dielectric properties and microstructure of deposited silicon nitride films may vary with process conditions, nitrogen partial pressure, substrate temperature and post-deposition treatment. The deposited film should therefore not be assumed to reproduce the composition or structure of the bulk target exactly.

Because Si₃N₄ ceramic targets are brittle and may be sensitive to thermal gradients, appropriate target cooling, uniform thermal contact and progressive power conditioning are recommended during operation.

Bonding services, backing plates, alternative thicknesses and custom target dimensions are available upon request.

Specification
Product Name Silicon Nitride Sputtering Target
Material Silicon Nitride
Chemical Formula Si₃N₄
Common Name Silicon Nitride
CAS Number 12033-89-5
Purity 99.99% (4N)
Material Type Nitride Ceramic
Crystal Phase Not Specified
Electrical Character Electrical Insulator / Dielectric
Calculated Molar Mass Approximately 140.28 g/mol
Typical Applications Dielectric Layers, Passivation Films, Protective and Barrier Coatings, Semiconductor Thin Films, Optical Coatings and Thin-Film Research
Shape Circular Disc
Standard Target Diameters Ø50.8 mm (2 in.), Ø76.2 mm (3 in.)
Standard Target Thickness 3 mm
Standard Target Sizes Ø50.8 × 3 mm (2 in.), Ø76.2 × 3 mm (3 in.)
Appearance White to Gray or Dark Gray Ceramic; Appearance May Vary by Manufacturing Process and Batch
Recommended Sputtering Mode RF Magnetron Sputtering
Alternative Thicknesses Available Upon Request
Bonded Configuration Available Upon Request
Custom Dimensions Available Upon Request

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