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- S4R InertBridge™ — Vacuum Transfer Chamber for Air-Sensitive SEM Samples
S4R InertBridge™ — Vacuum Transfer Chamber for Air-Sensitive SEM Samples
https://www.s4r.fr/shop/s4r-lbe-lmc0001a-s4r-inertbridgetm-vacuum-transfer-chamber-for-air-sensitive-sem-samples-204 https://www.s4r.fr/web/image/product.template/204/image_1920?unique=d611585The S4R InertBridge™ is a compact vacuum transfer chamber developed for the protected transfer of air-sensitive samples from a glovebox to a scanning electron microscope. Samples remain enclosed within an evacuated compartment during handling and transport, limiting their exposure to ambient oxygen, moisture, and laboratory contamination.
The chamber is evacuated and closed inside the glovebox. Under ambient conditions, the pressure differential across the cover maintains contact with the sealing interface. Once the InertBridge™ is installed inside the SEM and the microscope chamber is pumped down, the external pressure progressively decreases. When the resulting closing force becomes lower than the force exerted by the integrated spring mechanism, the cover moves laterally to expose the samples for observation.
The standard sample holder provides four Ø8 mm positions with a nominal position geometry of Ø8 × 0.5 mm. Alternative sample-holder geometries can be configured according to the intended samples and experimental workflow. A machine-specific SEM mounting adapter is included, with configurations available for selected ZEISS, JEOL, and Thermo Scientific platforms, as well as other microscope models following compatibility review.
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S4R InertBridge™
The S4R InertBridge™ is a compact vacuum transfer chamber developed for the protected transfer of air-sensitive samples from a glovebox to a scanning electron microscope.
A pressure-differential retention mechanism maintains the cover against the sealing interface during handling and transport, while an integrated spring drives its lateral opening during SEM pump-down.
Protected transfer through a compact pressure-responsive system
Designed to limit atmospheric exposure between controlled sample preparation in a glovebox and observation inside a scanning electron microscope.
Protected transfer from glovebox preparation to SEM observation
The complete procedure is carried out through six clearly defined steps, from sample preparation under controlled atmosphere to pressure-responsive sample exposure inside the SEM chamber.
Sample Preparation
Prepare and position the samples in the four-position sample holder under the required controlled-atmosphere conditions.
Chamber Loading
Insert the loaded sample holder into the InertBridge™ sample compartment and place the cover in its closing position.
Evacuation and Closure
Evacuate the sample compartment. The resulting pressure differential retains the cover against the sealing interface.
Glovebox-to-SEM Transfer
Remove the closed chamber from the glovebox and carry it to the SEM. The sample compartment remains sealed during handling and transfer.
SEM Installation
Install the InertBridge™ in the microscope using the dedicated model-specific SEM mounting adapter.
SEM Pump-Down and Opening
As SEM chamber pressure decreases, the retaining force diminishes until the spring drives the cover laterally and exposes the samples.
Passive release during SEM chamber evacuation
During transport under ambient laboratory pressure, the pressure outside the evacuated sample compartment is higher than the pressure inside it. The resulting pressure differential generates a net retaining force that holds the cover against the sealing interface.
As the SEM chamber is evacuated, the external pressure decreases and the net retaining force across the cover progressively diminishes. Once this force falls below the preload of the integrated spring mechanism, the cover is released and moves laterally to expose the samples.
Four-position holder with configurable sample-recess geometry
The standard InertBridge™ sample holder incorporates four cylindrical sample recesses. Each recess has a nominal diameter of Ø8 mm and a nominal depth of 0.5 mm.
Because the intended specimens are solid, the recess diameter and depth are the most relevant dimensional specifications. Alternative holder layouts can be evaluated according to the sample geometry and analytical workflow.
Model-specific integration across SEM platforms
The InertBridge™ is installed inside the microscope through a dedicated mounting adapter configured for the specified SEM model. One compatible mounting adapter is included according to the selected product configuration.
Adapter configurations are available for selected ZEISS, JEOL, and Thermo Scientific SEM models. Compatibility must be confirmed for the exact microscope model and stage configuration. Other platforms can be evaluated according to the mechanical interface, chamber clearance, stage geometry, and cover-opening envelope.
SEM characterization of air- and moisture-sensitive materials
Intended for mounted samples whose surface chemistry, morphology, or analytical response may be altered by exposure to ambient oxygen or moisture.
Compact geometry for SEM chamber integration
Refer to the dimensional drawing for the external envelope, mounting interface, sample position, and lateral cover-opening clearance.
S4R InertBridge™ Specifications
| Parameter | Specification |
|---|---|
| Product Type | Vacuum transfer chamber for air-sensitive samples intended for SEM analysis |
| Primary Transfer Route | Glovebox to scanning electron microscope |
| Sample-Protection Principle | Transfer inside an evacuated, closed sample compartment |
| Closure Principle | Pressure-differential retention against the sealing interface |
| Opening Principle | Pressure-responsive release with spring-driven lateral opening |
| Cover Movement | Spring-driven lateral opening |
| Powered In-Chamber Actuator | Not required |
| Standard Sample Capacity | 4 sample positions |
| Standard Sample-Recess Geometry | 4 cylindrical recesses, each Ø8 mm × 0.5 mm deep |
| Custom Sample Holder | Alternative geometries available upon request |
| Nominal Chamber Mass | 200 g |
| External Dimensions | Refer to the dimensional drawing |
| SEM Mounting Interface | Model-specific mounting adapter |
| Standard Platform Families | Selected ZEISS, JEOL, and Thermo Scientific SEM models; exact model confirmation required |
| Other SEM Platforms | Custom integration available following compatibility review |
| SEM Adapter | One compatible mounting adapter included according to the selected configuration |
| Positioning Stand | Dedicated positioning stand included |
| Vacuum Pump | Available as an option |
| Intended Operating Environment | Controlled-atmosphere sample loading followed by transfer to an SEM vacuum chamber |
Complete transfer chamber configuration
S4R InertBridge™
The S4R InertBridge™ is a compact vacuum transfer chamber developed for the protected transfer of air-sensitive samples from a glovebox to a scanning electron microscope.
A pressure-differential retention mechanism maintains the cover against the sealing interface during handling and transport, while an integrated spring drives its lateral opening during SEM pump-down.
Protected transfer through a compact pressure-responsive system
Designed to limit atmospheric exposure between controlled sample preparation in a glovebox and observation inside a scanning electron microscope.
Protected transfer from glovebox preparation to SEM observation
The complete procedure is carried out through six clearly defined steps, from sample preparation under controlled atmosphere to pressure-responsive sample exposure inside the SEM chamber.
Sample Preparation
Prepare and position the samples in the four-position sample holder under the required controlled-atmosphere conditions.
Chamber Loading
Insert the loaded sample holder into the InertBridge™ sample compartment and place the cover in its closing position.
Evacuation and Closure
Evacuate the sample compartment. The resulting pressure differential retains the cover against the sealing interface.
Glovebox-to-SEM Transfer
Remove the closed chamber from the glovebox and carry it to the SEM. The sample compartment remains sealed during handling and transfer.
SEM Installation
Install the InertBridge™ in the microscope using the dedicated model-specific SEM mounting adapter.
SEM Pump-Down and Opening
As SEM chamber pressure decreases, the retaining force diminishes until the spring drives the cover laterally and exposes the samples.
Passive release during SEM chamber evacuation
During transport under ambient laboratory pressure, the pressure outside the evacuated sample compartment is higher than the pressure inside it. The resulting pressure differential generates a net retaining force that holds the cover against the sealing interface.
As the SEM chamber is evacuated, the external pressure decreases and the net retaining force across the cover progressively diminishes. Once this force falls below the preload of the integrated spring mechanism, the cover is released and moves laterally to expose the samples.
Four-position holder with configurable sample-recess geometry
The standard InertBridge™ sample holder incorporates four cylindrical sample recesses. Each recess has a nominal diameter of Ø8 mm and a nominal depth of 0.5 mm.
Because the intended specimens are solid, the recess diameter and depth are the most relevant dimensional specifications. Alternative holder layouts can be evaluated according to the sample geometry and analytical workflow.
Model-specific integration across SEM platforms
The InertBridge™ is installed inside the microscope through a dedicated mounting adapter configured for the specified SEM model. One compatible mounting adapter is included according to the selected product configuration.
Adapter configurations are available for selected ZEISS, JEOL, and Thermo Scientific SEM models. Compatibility must be confirmed for the exact microscope model and stage configuration. Other platforms can be evaluated according to the mechanical interface, chamber clearance, stage geometry, and cover-opening envelope.
SEM characterization of air- and moisture-sensitive materials
Intended for mounted samples whose surface chemistry, morphology, or analytical response may be altered by exposure to ambient oxygen or moisture.
Compact geometry for SEM chamber integration
Refer to the dimensional drawing for the external envelope, mounting interface, sample position, and lateral cover-opening clearance.
S4R InertBridge™ Specifications
| Parameter | Specification |
|---|---|
| Product Type | Vacuum transfer chamber for air-sensitive samples intended for SEM analysis |
| Primary Transfer Route | Glovebox to scanning electron microscope |
| Sample-Protection Principle | Transfer inside an evacuated, closed sample compartment |
| Closure Principle | Pressure-differential retention against the sealing interface |
| Opening Principle | Pressure-responsive release with spring-driven lateral opening |
| Cover Movement | Spring-driven lateral opening |
| Powered In-Chamber Actuator | Not required |
| Standard Sample Capacity | 4 sample positions |
| Standard Sample-Recess Geometry | 4 cylindrical recesses, each Ø8 mm × 0.5 mm deep |
| Custom Sample Holder | Alternative geometries available upon request |
| Nominal Chamber Mass | 200 g |
| External Dimensions | Refer to the dimensional drawing |
| SEM Mounting Interface | Model-specific mounting adapter |
| Standard Platform Families | Selected ZEISS, JEOL, and Thermo Scientific SEM models; exact model confirmation required |
| Other SEM Platforms | Custom integration available following compatibility review |
| SEM Adapter | One compatible mounting adapter included according to the selected configuration |
| Positioning Stand | Dedicated positioning stand included |
| Vacuum Pump | Available as an option |
| Intended Operating Environment | Controlled-atmosphere sample loading followed by transfer to an SEM vacuum chamber |
Complete transfer chamber configuration
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